DIELECTRIC PROPERTY MEASUREMENT SYSTEM AT CRYOGENIC TEMPERATURES AND MICROWAVE-FREQUENCIES

by MOLLA, J., IBARRA, A., MARGINEDA, J., ZAMARRO, J. M. and HERNANDEZ, A.
Reference:
DIELECTRIC PROPERTY MEASUREMENT SYSTEM AT CRYOGENIC TEMPERATURES AND MICROWAVE-FREQUENCIES (MOLLA, J., IBARRA, A., MARGINEDA, J., ZAMARRO, J. M. and HERNANDEZ, A.), In IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, volume 42, 1993.
Bibtex Entry:
@article{nr982,
	Author = {MOLLA, J. and IBARRA, A. and MARGINEDA, J. and ZAMARRO, J. M. and HERNANDEZ, A.},
	Date = {AUG 1993},
	Date-Added = {2013-10-12 14:28:32 +0000},
	Date-Modified = {2013-10-12 14:28:32 +0000},
	Doi = {10.1109/19.234491},
	Isi = {WOS:A1993LY45600005},
	Issn = {0018-9456},
	Journal = {IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT},
	Month = {Aug},
	Number = {4},
	Pages = {817--821},
	Publication-Type = {J},
	Times-Cited = {28},
	Title = {DIELECTRIC PROPERTY MEASUREMENT SYSTEM AT CRYOGENIC TEMPERATURES AND MICROWAVE-FREQUENCIES},
	Volume = {42},
	Year = {1993},
	Z8 = {1},
	Z9 = {29},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1109/19.234491}}