ADVANCED TECHNIQUES FOR MICROWAVE REFLECTOMETRY

by SANCHEZ, J., BRANAS, B., DELALUNA, E., ESTRADA, T., ZHURAVLEV, V., HARTFUSS, H. J., HIRSCH, M., GEIST, T., SEGOVIA, J. and ORAMAS, J. L.
Reference:
ADVANCED TECHNIQUES FOR MICROWAVE REFLECTOMETRY (SANCHEZ, J., BRANAS, B., DELALUNA, E., ESTRADA, T., ZHURAVLEV, V., HARTFUSS, H. J., HIRSCH, M., GEIST, T., SEGOVIA, J. and ORAMAS, J. L.), In PLASMA PHYSICS REPORTS, volume 20, 1994.
Bibtex Entry:
@article{nr976,
	Author = {SANCHEZ, J. and BRANAS, B. and DELALUNA, E. and ESTRADA, T. and ZHURAVLEV, V. and HARTFUSS, H. J. and HIRSCH, M. and GEIST, T. and SEGOVIA, J. and ORAMAS, J. L.},
	Date = {JAN 1994},
	Date-Added = {2013-10-12 14:28:32 +0000},
	Date-Modified = {2013-10-12 14:28:32 +0000},
	Isi = {WOS:A1994NP34100001},
	Issn = {1063-780X},
	Journal = {PLASMA PHYSICS REPORTS},
	Month = {Jan},
	Number = {1},
	Pages = {1--6},
	Publication-Type = {J},
	Times-Cited = {4},
	Title = {ADVANCED TECHNIQUES FOR MICROWAVE REFLECTOMETRY},
	Volume = {20},
	Year = {1994},
	Z8 = {0},
	Z9 = {4},
	ZB = {0},
	ZS = {0}}