Investigating chemical structure in a silicon CCD using extended X-ray absorption fine structure

by Keay, A., Wells, A., Owens, A. and McCarthy, K. J.
Reference:
Investigating chemical structure in a silicon CCD using extended X-ray absorption fine structure (Keay, A., Wells, A., Owens, A. and McCarthy, K. J.), In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, volume 124, 1997.
Bibtex Entry:
@article{nr888,
	Author = {Keay, A. and Wells, A. and Owens, A. and McCarthy, K. J.},
	Date = {MAY 1997},
	Date-Added = {2013-10-12 14:28:32 +0000},
	Date-Modified = {2013-10-12 14:28:32 +0000},
	Doi = {10.1016/S0168-583X(97)00115-8},
	Isi = {WOS:A1997WY06700026},
	Issn = {0168-583X},
	Journal = {NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
	Month = {May},
	Number = {4},
	Pages = {615--623},
	Publication-Type = {J},
	Times-Cited = {1},
	Title = {Investigating chemical structure in a silicon CCD using extended X-ray absorption fine structure},
	Volume = {124},
	Year = {1997},
	Z8 = {0},
	Z9 = {1},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1016/S0168-583X(97)00115-8}}