Self-adaptive sampling rate data acquisition in JET’s correlation reflectometer

by de Arcas, G., Lopez, J. M., Ruiz, M., Barrera, E., Vega, J., Murari, A. and Fonseca, A.
Reference:
Self-adaptive sampling rate data acquisition in JET’s correlation reflectometer (de Arcas, G., Lopez, J. M., Ruiz, M., Barrera, E., Vega, J., Murari, A. and Fonseca, A.), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 79, 2008.
Bibtex Entry:
@article{nr386,
	Author = {de Arcas, G. and Lopez, J. M. and Ruiz, M. and Barrera, E. and Vega, J. and Murari, A. and Fonseca, A.},
	CL = {Albuquerque, NM},
	CT = {17th Topical Conference on High-Temperature Plasma Diagnostics},
	CY = {2008},
	Date = {OCT 2008},
	Date-Added = {2013-10-12 14:28:31 +0000},
	Date-Modified = {2013-10-12 14:28:31 +0000},
	Doi = {10.1063/1.2965011},
	Group-Authors = {JET-EFDA Contributors},
	Isi = {WOS:000260573500255},
	Issn = {0034-6748},
	Journal = {REVIEW OF SCIENTIFIC INSTRUMENTS},
	Month = {Oct},
	Number = {10},
	Pages = {10F336},
	Publication-Type = {J},
	RI = {Ruiz, Mariano/H-3309-2011; Barrera, Eduardo/H-4196-2011},
	Times-Cited = {3},
	Title = {Self-adaptive sampling rate data acquisition in JET's correlation reflectometer},
	Volume = {79},
	Year = {2008},
	Z8 = {0},
	Z9 = {3},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1063/1.2965011}}