On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry

by Happel, T., Blanco, E. and Estrada, T.
Reference:
On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry (Happel, T., Blanco, E. and Estrada, T.), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 81, 2010.
Bibtex Entry:
@article{nr218,
	Author = {Happel, T. and Blanco, E. and Estrada, T.},
	CL = {Wildwood, NJ},
	CT = {18th Topical Conference on High-Temperature Plasma Diagnostics},
	CY = {MAY 16-20, 2010},
	Date = {OCT 2010},
	Date-Added = {2013-10-12 14:28:31 +0000},
	Date-Modified = {2013-10-12 14:28:31 +0000},
	Doi = {10.1063/1.3464475},
	Isi = {WOS:000283754000121},
	Issn = {0034-6748},
	Journal = {REVIEW OF SCIENTIFIC INSTRUMENTS},
	Month = {Oct},
	Number = {10},
	Pages = {10D901},
	Publication-Type = {J},
	RI = {Happel, Tim/A-2307-2009},
	Times-Cited = {4},
	Title = {On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry},
	Volume = {81},
	Year = {2010},
	Z8 = {0},
	Z9 = {4},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1063/1.3464475}}