Radiation induced electrical and microstructural degradation at high temperature for HP SiC

by Hernandez, T., Hodgson, E. R., Malo, M. and Morono, A.
Reference:
Radiation induced electrical and microstructural degradation at high temperature for HP SiC (Hernandez, T., Hodgson, E. R., Malo, M. and Morono, A.), In FUSION ENGINEERING AND DESIGN, volume 86, 2011.
Bibtex Entry:
@article{nr128,
	Author = {Hernandez, T. and Hodgson, E. R. and Malo, M. and Morono, A.},
	CL = {Porto, PORTUGAL},
	CT = {26th Symposium on Fusion Technology (SOFT)},
	CY = {SEP 27-OCT 01, 2010},
	Date = {OCT 2011},
	Date-Added = {2013-10-12 14:28:31 +0000},
	Date-Modified = {2013-10-12 14:28:31 +0000},
	Doi = {10.1016/j.fusengdes.2010.12.064},
	Isi = {WOS:000297824000205},
	Issn = {0920-3796},
	Journal = {FUSION ENGINEERING AND DESIGN},
	Month = {Oct},
	Number = {9-11},
	Pages = {2442--2445},
	Publication-Type = {J},
	Times-Cited = {1},
	Title = {Radiation induced electrical and microstructural degradation at high temperature for HP SiC},
	Volume = {86},
	Year = {2011},
	Z8 = {0},
	Z9 = {1},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1016/j.fusengdes.2010.12.064}}